Debug & Optimization Development

The basics of sigma delta analog-to-digital converters

The authors review the basics of sigma delta ADCs. Read More

Mixed signal verification of Sigma Delta ADCs in an SoC

The authors present a method of doing mixed signal verification for use in performing dynamic tests of sigma delta ADCs in an SoC. Read More

The millennium bug revisited

Colin Walls considers the possibility of a repeat of the “millennium bug” (aka Y2K) panic, when it was thought that timers in systems might not be... Read More

DO-254: Increasing verification coverage by test

Verification coverage by test is essential to satisfying both the objectives of DO-254 and interpretation in FAA Order 8110.105. However, verification ... Read More

Reducing tester-based silicon debug effort & time: Part 2 – A check-list of best practices

A detailed check list of must-do practices to follow during the verification for testing (VFT). Read More

Reducing tester-based silicon debug effort & time: Part 1 – Testing modes

The pros and cons of the silicon test and debug phases an SoC must go through and the techniques and tools available to the test engineer. Read More

Mastering stack and heap for system reliability: Part 3 - Avoiding heap errors

In the last of a three part series, the authors deal with broad guidelines for proper heap design, methods to employ to avoid errors and provides some ... Read More

Software performance engineering for embedded systems Part 3 – Collecting data and using it effectively

In the final part in a series of three articless excerpted from his soon-to-be published “Software Engineering for Embedded Systems”, Freescale’s... Read More

Efficient I2C Bus debug using Mixed Signal Oscilloscopes

Dave Pereles provides some helpful guidelines on how to replace traditional manual methods for debugging the Inter-IC (I2C) bus connections in your... Read More

Mastering stack and heap for system reliability: Part 2 - Properly allocating stacks

In the second in a three part series on techniques for allocating memory stack and heap in embedded systems, Anders Lundgren and Lotta Frimanson focus ... Read More

Using RTOS-aware debugging and Serial Wire Viewer to debug Cortex-M3/M4 designs

Mark Moran of Atollic Inc. explains how to use a combination of RTOS or kernel aware (KA) debugging, and Serial Wire Viewer (SWV) to debug... Read More

Verifying embedded software functionality: Combining formal verification with testing

In the final part in a four-part series, Abhik Roychoudhury, author of "Embedded Systems and software validation" explains the usefulness of formal... Read More

Verifying embedded software functionality: fault localization, metrics and directed testing

In the third in a four part series Abhik Roychoudhury, author of “Embedded Systems and software validation” discusses the pros and cons of metric base ... Read More

Mastering stack and heap for system reliability: Part 1 – Calculating stack size

In this three part series, Anders Lundgren and Lotta Frimanson take you step by step through the techniques for allocating stack and heap in embedded... Read More

Verifying embedded software functionality: The power of dynamic slicing

In the second in a four part series, Abhik Roychoudhury, author of "Embedded Systems and Software Validation" details the ways in which dynamic... Read More

Verifying embedded software functionality: Why it’s necessary

In this four-part series, Abhik Roychoudhury, author of Embedded Systems and software validation, explains why it is important for embedded developers ... Read More

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The basics of sigma delta analog-to-digital converters

Mixed signal verification of Sigma Delta ADCs in an SoC

The millennium bug revisited

DO-254: Increasing verification coverage by test

Reducing tester-based silicon debug effort & time: Part 2 – A check-list of best practices

Reducing tester-based silicon debug effort & time: Part 1 – Testing modes

Mastering stack and heap for system reliability: Part 3 - Avoiding heap errors

Software performance engineering for embedded systems Part 3 – Collecting data and using it effectively

Efficient I2C Bus debug using Mixed Signal Oscilloscopes

Mastering stack and heap for system reliability: Part 2 - Properly allocating stacks

Using RTOS-aware debugging and Serial Wire Viewer to debug Cortex-M3/M4 designs

Verifying embedded software functionality: Combining formal verification with testing

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03.25.2013

Coverity offers free code test for open source, Java apps
03.02.2013

PRQA brings continuous inspection to QA Verify
02.15.2013

Embvue brings its tools to NI’s Test Management suite
01.31.2013

Best in Test Award winners announced
01.28.2013

EEMBC updates, expands its Android benchmark

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04.18.2013

Symtavision adds Ethernet timing analysis to SymTA/S
04.17.2013

ASSET jacks up performance of IJTAG tool
04.16.2013

Multi TimeMachine features trace tools for MIPS and Renesas MCUs
02.26.2013

SymTA/S 3.3 features new timing analysis and design capabilities
01.28.2013

DesignCon: Tektronix 30 GHz probing system touts low noise, high bandwidth

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29 November 2012

Test-driven development (TDD)

The software development process in which developers write automated test cases first, bare-bones code next, and then iteratively test and tinker their way to perfection. Read More

29 November 2012

Unit testing

A collection of content on unit testing in embedded systems. Unit testing is the method of breaking software code into its basic units and testing the units separately to see that they each function correctly. Read More

30 November 2012

Embedded Market Surveys

The Embedded Market Survey has been tracking trends in embedded systems every year since the early 1990s. Here is the archived results of the surveys by year, plus links to articles based on the results. Read More
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Sponsored by Tektronix 15 March 2013

ABCs of Probes

In this paper, you'll learn what contributes to the strengths and weaknesses of probes and how to select the right probe for your application. Read More

Sponsored by ARM 12 March 2013

Analyzing and Debugging Performance Issues with complex ARM CoreLink System IP Components

The complexity of today's SoC, with many heterogeneous processors, requires innovative on-chip interconnect fabrics to meet performance, power, and area targets. This paper describes technology and solutions that can accelerate this process to reduce time ... Read More

Sponsored by Hioki E.E. Corporation 21 March 2013

High Performance Power Analyzers Improve the Efficiency of Testing Alternative Energy Technologies and Energy Saving Devices

This paper covers recent power meter trends and measurement needs surrounding the use of high-precision power supply analyzers to support the development of high-efficiency control systems. Read More

Sponsored by Tektronix 15 March 2013

Coherent Optical Signal Generation with High-Performance AWG

Learn how instrument characteristics and performance level of the AWG70000 influence the ability to generate different modulation schemes and the way the instrument's flexibility can be used to compensate for internal and external device imperfections and ... Read More

Sponsored by Rohde & Schwarz 06 April 2013

Higher Order MIMO Testing with the SMW200A Vector Signal Generator

This application note explains how to use the SMW for testing higher order MIMO systems by presenting different key applications. Read More
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Sponsored by Xilinx, Inc. 26 September 2012

C Code to Co-Processing Accelerator on Zynq™-7000 All Programmable SoCs

Learn how to rapidly accelerate your C algorithms by using Vivado High-Level Synthesis to implement co-processing accelerators on Zynq-7000 All Programmable SoC. See a step-by-step example of how system and design architects and embedded software... Read More

Sponsored by Rohde & Schwarz 09 October 2012

OTA Measurements of LTE MIMO-Enabled Devices

Over-the-air (OTA) measurements are commonly used to determine the wireless system performance of wireless-enabled devices aside from field testing. LTE has introduced MIMO in order to improve network performance. This webinar presents a straightforward... Read More

Sponsored by Rohde & Schwarz 14 November 2012

Wideband Complex Modulation Analysis Using a Real-Time Digital Demodulator

Wide bandwidth modulation is becoming more common in communications. The emergence of standards such as the 802.11ac has extended the modulation bandwidth to 160 MHz which requires very wide band measurement equipment to measure. This session will present ... Read More

Sponsored by Maxim Integrated 07 November 2012

Temperature Sensor Interfaces: Simplifying thermocouple and RTD conversion

This webinar will cover the basics of temperature measurement with thermocouples and platinum RTDs (Resistance Temperature Detectors). We will show the standard approaches to interfacing with those sensors and introduce new interface ICs that simplify the ... Read More

Sponsored by Analog Devices 13 March 2013

Low Power Smart Transmitters Design

In this webcast we will explore some of the key trends in modern field instrument design, the most complex of which are high performance, low power and increased diagnostic capabilities. We will examine the power consumption challenges of loop-powered... Read More
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Sponsored by Apache Design 14 May 2012

RedHawk-3DX: Dynamic Power Sign-Off

Low-power ICs are becoming increasing complex, often surpassing Moore's Law in order to maintain expanding functionality and performance needs. To stay within the power budget, these designs leverage ultra-low sub-1V supply voltage levels. And to meet... Read More

17 May 2012

Fundamentals of Instrument Control

Traditionally, engineers used test instruments manually to make measurements and acquire data. However, as testing has evolved to cope with more complex measurement problems, and engineers look to maximize return on investment from expensive... Read More

Sponsored by Tektronix 05 July 2012

Integrated ZigBee Radio Implementation and Testing

As low cost radio technologies proliferate through many electronic product applications, streamlining validation and verification of ZigBee module performance is important. This Webinar demonstrates the utility and simplicity of the Tektronix MDO4000... Read More

Sponsored by Tektronix 06 July 2012

Fundamentals of Mixed Domain Oscilloscopes

This video course is ideal for the embedded designer that is attempting to understand the RF signal integrity of their design and correlate time and frequency measurements. Read More

Sponsored by National Instruments 10 December 2012

Fundamentals of Modular Instrumentation

The course explores the basic components of a modular system and key considerations when choosing products. It also shows how modular instruments may be integrated together with traditional instruments, and concludes by examining two successful case... Read More
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Save & Follow 15 March 2013

In this paper, you'll learn what contributes to... Read More

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