Debug & Optimization Development

The millennium bug revisited

Colin Walls considers the possibility of a repeat of the “millennium bug” (aka Y2K) panic, when it was thought that timers in systems might not be... Read More

DO-254: Increasing verification coverage by test

Verification coverage by test is essential to satisfying both the objectives of DO-254 and interpretation in FAA Order 8110.105. However, verification ... Read More

Reducing tester-based silicon debug effort & time: Part 2 – A check-list of best practices

A detailed check list of must-do practices to follow during the verification for testing (VFT). Read More

Reducing tester-based silicon debug effort & time: Part 1 – Testing modes

The pros and cons of the silicon test and debug phases an SoC must go through and the techniques and tools available to the test engineer. Read More

Mastering stack and heap for system reliability: Part 3 - Avoiding heap errors

In the last of a three part series, the authors deal with broad guidelines for proper heap design, methods to employ to avoid errors and provides some ... Read More

Software performance engineering for embedded systems Part 3 – Collecting data and using it effectively

In the final part in a series of three articless excerpted from his soon-to-be published “Software Engineering for Embedded Systems”, Freescale’s... Read More

Efficient I2C Bus debug using Mixed Signal Oscilloscopes

Dave Pereles provides some helpful guidelines on how to replace traditional manual methods for debugging the Inter-IC (I2C) bus connections in your... Read More

Mastering stack and heap for system reliability: Part 2 - Properly allocating stacks

In the second in a three part series on techniques for allocating memory stack and heap in embedded systems, Anders Lundgren and Lotta Frimanson focus ... Read More

Using RTOS-aware debugging and Serial Wire Viewer to debug Cortex-M3/M4 designs

Mark Moran of Atollic Inc. explains how to use a combination of RTOS or kernel aware (KA) debugging, and Serial Wire Viewer (SWV) to debug... Read More

Verifying embedded software functionality: Combining formal verification with testing

In the final part in a four-part series, Abhik Roychoudhury, author of "Embedded Systems and software validation" explains the usefulness of formal... Read More

Verifying embedded software functionality: fault localization, metrics and directed testing

In the third in a four part series Abhik Roychoudhury, author of “Embedded Systems and software validation” discusses the pros and cons of metric base ... Read More

Mastering stack and heap for system reliability: Part 1 – Calculating stack size

In this three part series, Anders Lundgren and Lotta Frimanson take you step by step through the techniques for allocating stack and heap in embedded... Read More

Verifying embedded software functionality: The power of dynamic slicing

In the second in a four part series, Abhik Roychoudhury, author of "Embedded Systems and Software Validation" details the ways in which dynamic... Read More

Verifying embedded software functionality: Why it’s necessary

In this four-part series, Abhik Roychoudhury, author of Embedded Systems and software validation, explains why it is important for embedded developers ... Read More

Automated tools streamline software test and certification

In this Product How-To Jared Fry and Shan Bhattacharya of LDRA describe how the company’s tool suite can be used to analyze code to trace... Read More

Troubleshoot and verify 8b/10b encoded signals with a real-time oscilloscope

An update on the latest techniques for using a real-time oscilloscope to troubleshoot and verify the signal integrity of devices with 8b/10b serial... Read More

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The millennium bug revisited

DO-254: Increasing verification coverage by test

Reducing tester-based silicon debug effort & time: Part 2 – A check-list of best practices

Reducing tester-based silicon debug effort & time: Part 1 – Testing modes

Mastering stack and heap for system reliability: Part 3 - Avoiding heap errors

Software performance engineering for embedded systems Part 3 – Collecting data and using it effectively

Efficient I2C Bus debug using Mixed Signal Oscilloscopes

Mastering stack and heap for system reliability: Part 2 - Properly allocating stacks

Using RTOS-aware debugging and Serial Wire Viewer to debug Cortex-M3/M4 designs

Verifying embedded software functionality: Combining formal verification with testing

Verifying embedded software functionality: fault localization, metrics and directed testing

Mastering stack and heap for system reliability: Part 1 – Calculating stack size

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12.19.2012

Agilent software decodes MIPI Unified & LLI protocols

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01.28.2013

DesignCon: Tektronix 30 GHz probing system touts low noise, high bandwidth
01.10.2013

ew: New version of PLS Universal Debug Engine enhances multicore dev
12.02.2012

Integration of JTAGjet-Trace and IAR Embedded Workbench eases ARM development
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DESIGN East - Parasoft introduces its Open Embedded Testing Platform
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Boundary-scan controller supports PXIe/Compact PCI-express slot

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Break Points
Jack Ganssle

The well-engineered µCurrent
Barr Code
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Trends in embedded software design
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Implementing pure virtual functions
Programmer's Toolbox
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Classic Crenshaw: All about vectors

Tech Papers

Webinars

Courses

Sponsored by Averna Technologies 23 November 2012

Record and Playback for GNSS Testing: High Performance for Real Applications

Read this white paper to learn how Averna's RP can replay signals so that its impairments are undetectable or irrelevant for most GNSS receivers/applications, while reducing the time and resources required for real-time, real-world GNSS signal testing. Read More

Sponsored by Rohde & Schwarz 01 December 2012

Interaction of Intermodulation Products between DUT and Spectrum Analyzer

This white paper describes the interaction between intermodulation products generated by a device under test (DUT) and intermodulation products generated internally in a spectrum analyzer. Read More

Sponsored by ASSET InterTech, Inc. 02 January 2013

Solving the problem of diminishing test coverage from in-circuit test (ICT)

This paper explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. Read More

Sponsored by Synopsys 01 December 2012

From Design to Test: Developing High-Reliability MTP NVM

To help system-on-chip (SoC) designers select the highest reliability NVM IP, this white paper reviews the key considerations involved in the entire process from design to test, including: key reliability specifications; designing-in reliability; and... Read More

Sponsored by Teledyne LeCroy 08 January 2013

Characterizing Crosstalk with Aggressor On/Off Analysis Using SDAIII-CompleteLinQ

Designers of high-speed serial data systems can characterize the level of crosstalk present on signals by using SDAIII-CompleteLinQ. Read More
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Sponsored by PTC 20 September 2012

Rethink your Systems Engineering Approach to Combat Complexity in Product Development

Engineering executives are increasingly challenged to accelerate the delivery of innovative products and manage the proliferation of product variants with fewer resources, while improving quality. The only way to overcome these challenges is through a... Read More

Sponsored by Xilinx 26 September 2012

C Code to Co-Processing Accelerator on Zynq™-7000 All Programmable SoCs

Learn how to rapidly accelerate your C algorithms by using Vivado High-Level Synthesis to implement co-processing accelerators on Zynq-7000 All Programmable SoC. See a step-by-step example of how system and design architects and embedded software... Read More

Sponsored by Rohde & Schwarz 09 October 2012

OTA Measurements of LTE MIMO-Enabled Devices

Over-the-air (OTA) measurements are commonly used to determine the wireless system performance of wireless-enabled devices aside from field testing. LTE has introduced MIMO in order to improve network performance. This webinar presents a straightforward... Read More

Sponsored by Rohde & Schwarz 14 November 2012

Wideband Complex Modulation Analysis Using a Real-Time Digital Demodulator

Wide bandwidth modulation is becoming more common in communications. The emergence of standards such as the 802.11ac has extended the modulation bandwidth to 160 MHz which requires very wide band measurement equipment to measure. This session will present ... Read More

Sponsored by Maxim Integrated 07 November 2012

Temperature Sensor Interfaces: Simplifying thermocouple and RTD conversion

This webinar will cover the basics of temperature measurement with thermocouples and platinum RTDs (Resistance Temperature Detectors). We will show the standard approaches to interfacing with those sensors and introduce new interface ICs that simplify the ... Read More
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Sponsored by Apache Design 14 May 2012

RedHawk-3DX: Dynamic Power Sign-Off

Low-power ICs are becoming increasing complex, often surpassing Moore's Law in order to maintain expanding functionality and performance needs. To stay within the power budget, these designs leverage ultra-low sub-1V supply voltage levels. And to meet... Read More

Sponsored by National Instruments 17 May 2012

Fundamentals of Instrument Control

Traditionally, engineers used test instruments manually to make measurements and acquire data. However, as testing has evolved to cope with more complex measurement problems, and engineers look to maximize return on investment from expensive... Read More

Sponsored by Tektronix 05 July 2012

Integrated ZigBee Radio Implementation and Testing

As low cost radio technologies proliferate through many electronic product applications, streamlining validation and verification of ZigBee module performance is important. This Webinar demonstrates the utility and simplicity of the Tektronix MDO4000... Read More

Sponsored by Tektronix 06 July 2012

Fundamentals of Mixed Domain Oscilloscopes

This video course is ideal for the embedded designer that is attempting to understand the RF signal integrity of their design and correlate time and frequency measurements. Read More

Sponsored by National Instruments 10 December 2012

Fundamentals of Modular Instrumentation

The course explores the basic components of a modular system and key considerations when choosing products. It also shows how modular instruments may be integrated together with traditional instruments, and concludes by examining two successful case... Read More
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Save & Follow 23 November 2012

Read this white paper to learn how Averna's RP can ... Read More

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