All Debug & Optimization Products
Finding best practices in software and hardware testing, debugging, optimization, and emulation.
All Debug & Optimization Products
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Measuring RF radiation in industrial environments
Two portable instruments from Narda Safety Test Systems are designed for measurement of... Read More
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VeriStand 2011 updated, works with Inertia
NI VeriStand 2011 is the latest version of the configuration-based software environment for creating ... Read More
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GUI eases JTAG/boundary scan project development
Cascon Mission Assist is graphical user interface for the Goepel System Cascon JTAG/boundary scan... Read More
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CDNE coupling/decoupling network for emission testing
Teseq has developed a coupling/decoupling (CDNE) network for emissions testing to meet the latest... Read More
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JTAG solution for Teradyne ICTs
The USB-1149.1/CFM JTAG hardware platform from Corelis Inc. integrates advanced boundary-scan test... Read More
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Signal generator raises bar to 40 GHz
Rohde & Schwarz has enhanced its analog R&S SMB100A mid-range signal generator by adding new... Read More
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Differential probes provide high signal fidelity
Rohde & Schwarz has developed differential probes for applications that require high sensitivity, a... Read More
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M200 OTDR has updated user interface
Fujikura Europe has released the M200 OTDR with a new user Interface (UI) that will reduce training... Read More
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Test tool upgraded for use with S530
The Keithley Test Environment (KTE) semiconductor test software has been upgraded to version 5.3 and ... Read More
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R&S adds 600 MHz scope to RTO family
Rohde & Schwarz has added a 600 MHz model to the existing models with 1 GHz and 2 GHz bandwidths in... Read More
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Option turns RTO scopes in to MSOs
Rohde & Schwarz has developed an mixed signal oscilloscope (MSO) option for use with its RTO... Read More
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FSW analyzer shows multiple measurements in single window
Rohde & Schwarz has developed the FSW signal and spectrum analyzer in three models that cover the... Read More
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SourceMeter optimized for low voltage testing
Keithley Instruments Inc. has expanded Series 2400 SourceMeter instrument family with the 2401 with ... Read More
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Logic analyzer option cut costs for data capture
Agilent Technologies Inc. has added a lower-priced entry-level 1.4-Gb/sec state mode option for its... Read More
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Software speeds analysis of active optical and direct attach cables
Anritsu has released two software packages for its MP2100A BERTWave series that create a... Read More
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Patented technology used in positional current probe
Aim-TTi has launched an entirely new type of current probe which is cable of measuring currents in... Read More
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USB scope adds signal generator
The PicoScope 4262 from Pico Technology is a 2‑channel, 16‑bit oscilloscope with a built-in... Read More
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Scope and spectrum analyzer combination provides time correlated analog, digital and RF signals
To address its belief that more than 60 percent of oscilloscope users also use a spectrum analyzer... Read More
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Modules cut costs for semiconductor characterization and test
National Instruments has expanded its PXI platform for semiconductor characterisation and production ... Read More
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Corelis integrates JTAG software with NI tools
Corelis Inc. is supporting National Instruments High Speed Digital I/O (HSDIO) instruments with its... Read More
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The millennium bug revisited
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Mastering stack and heap for system reliability: Part 1 – Calculating stack size
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Basics of real-time measurement, control, and communication using IEEE 1588: Part 5
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Basics of real-time measurement, control, and communication using IEEE 1588: Part 6
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Corelis updates boundary-scan tools
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