All Debug & Optimization Products
Finding best practices in software and hardware testing, debugging, optimization, and emulation.
All Debug & Optimization Products
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AOTU4 mapping option for MD1260A analyzer
25 August 2011
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An OTU4 mapping option for Anritsu's MD1260A 40/100G Ethernet Analyzer that extends the overall... Read More
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PLS offers optimized dev tools for Infineon's new TC1791, TC1793 and TC1798 AUDO MAX 32-bit MCUs
23 August 2011
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Programmierbare Logik & Systeme's (PLS) Universal Debug Engine (UDE) 3.0.10, Universal Access Device ... Read More
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Testing Mobile High-Definition Link compliance
16 August 2011
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Tektronix Inc.is providing a Mobile High-Definition Link (MHL) compliance test solution that works... Read More
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Software enables single-instrument WLAN measurement
16 August 2011
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Software for the Anritsu MS269xA and MS2830A series signal analyzers, as well as the MG3700A vector... Read More
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USB format for 5 GS/s digitizer
10 August 2011
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The PicoScope 6407 USB digitizer from Pico Technology has four 1 GHz 50-ohm analog inputs and a 5... Read More
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Glitch-free sensor simulation instrument
10 August 2011
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The EX1200-7008 multichannel universal RTD simulator from VTI Instruments Corp. is designed to... Read More
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Smartphone test platform in reduced footprint
03 August 2011
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A test system that claims to revolutionizes the way multi-radio devices such as smartphones and USB... Read More
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Lauterbach TRACE32 now supports MIPS32 M14K
02 August 2011
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Lauterbach TRACE32 debuggers now support MPS Technologies' MIPS32 M14K and M14Kc processor cores. Read More
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PXI RF test performance extended to 14 GHz
02 August 2011
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A 14 GHz version of the National Instruments PXIe-5665 RF vector signal analyser (VSA) has been... Read More
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IBM SiGe technology boosts oscilloscope sampling rate to 100 GS/s
01 August 2011
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Tektronix Inc. has released details of four DPO/DSA70000D series oscilloscope models that use the... Read More
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Wind River's Android test development kit replicates human interactions
27 July 2011
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Wind River's UX Test Development Kit is an Eclipse-based test-authoring environment enabling the... Read More
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MW signal generator range extended
27 July 2011
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The Giga-tronics 2500B series high-performance microwave signal generators cover 100 kHz to 50 GHz... Read More
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60MHz oscilloscope has deep memory
2 comments 27 July 2011
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The OWON SDS6062 two-channel benchtop scope with a 10 Msample record length for each channel is... Read More
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Single-channel arbitrary waveform/function generator
20 July 2011
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The 5325 50MS/s PCIbus arbitrary waveform/function generator from Tabor Electronics is a... Read More
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PXI-based semiconductor test system
20 July 2011
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The TS-900 PXI-based test system from Geotest for component, SoC and SiP test applications.... Read More
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Multi-mode signaling tester for 2G to 4G-LTE
19 July 2011
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The MD8475A signaling tester from Anritsu is for a range of applications and operating systems on... Read More
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Expanding range of fault insertion PXI modules
13 July 2011
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Pickering Interfaces is expanding its range of PXI Fault Insertion solutions with the introduction... Read More
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LeCroy extends analysis and simulation
13 July 2011
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LeCroy Corp. has extended its Signal Integrity Studio (SI Studio), an add-on to the SPARQ... Read More
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SIRC provides optical waveform analysis
06 July 2011
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A measurement solution for optical transmitter compliance testing on the Agilent 86100D digital... Read More
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Passive probe adds evaluation of mounted devices
06 July 2011
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The J1512A passive probe for the Anritsu BERTWave MP2100A BERT and EYE/Pulse Scope solution is also... Read More
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Mixed signal verification of Sigma Delta ADCs in an SoC
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The millennium bug revisited
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Basics of real-time measurement, control, and communication using IEEE 1588: Part 5
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Basics of real-time measurement, control, and communication using IEEE 1588: Part 6
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Mastering stack and heap for system reliability: Part 1 – Calculating stack size
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