All Debug & Optimization News
Finding best practices in software and hardware testing, debugging, optimization, and emulation.
All Debug & Optimization News
-
Best in Test Award winners announced
31 January 2013
Save & Follow
Here are the best new test equipment in 2013, according to Test & Measurement World community. Read More
-
EEMBC updates, expands its Android benchmark
28 January 2013
Save & Follow
Consortium releases a new version of ANDEbench 1.0 and a working group is developing on a second... Read More
-
DesignCon offers free expo passes
11 January 2013
Save & Follow
Explore the latest in chip and systems design at DesignCon 2013. Access to expo floor is free. Read More
-
Eclipse IDE comes to IAR’s ARM Workbench
01 January 2013
Save & Follow
By merging the Eclipse IDE with IAR’s tool chain, developers get a highly optimized ARM compiler and ... Read More
-
Agilent software decodes MIPI Unified & LLI protocols
19 December 2012
Save & Follow
Agilent’s new protocol decoders are designed to run on the company's Infiniium 90000 Series... Read More
-
LDRA joins FACE Consortium
11 September 2012
Save & Follow
LDRA, a provider of automated software verification, source code analysis and test tools, has joined ... Read More
-
GrammaTech transforms code analysis with visualization
29 March 2012
Save & Follow
GrammaTech’s next-generation software architecture visualization system scales to millions of lines... Read More
-
Agilent aids NXP in WiGig RFIC demo at CES
11 January 2012
Save & Follow
NXP Semiconductors is using test equipment from Agilent Technologies Inc. in a demonstration of its... Read More
-
CES: Compliance software supports link layer Spec V1.0
11 January 2012
Save & Follow
A compliance test suite revealed at CES by LeCroy Corp. is an approved Link Verification System... Read More
-
Fourth-gen SiGe process provides scope's 60 GHz bandwidth
03 January 2012
Save & Follow
The LabMaster 10 Zi oscilloscope from LeCroy Corp combines patented digital bandwidth interleave... Read More
Most Read
-
The millennium bug revisited
-
Mastering stack and heap for system reliability: Part 1 – Calculating stack size
-
Basics of real-time measurement, control, and communication using IEEE 1588: Part 5
-
Basics of real-time measurement, control, and communication using IEEE 1588: Part 6
-
Corelis updates boundary-scan tools
