All Debug & Optimization Products
Finding best practices in software and hardware testing, debugging, optimization, and emulation.
All Debug & Optimization Products
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DesignCon: Tektronix 30 GHz probing system touts low noise, high bandwidth
28 January 2013
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The new P7600 Series Probing System from Tektronix, Inc. features probe-specific DSP filters that... Read More
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ew: New version of PLS Universal Debug Engine enhances multicore dev
10 January 2013
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PLS Universal Debug Engine 4.0 features greatly enhanced debug capabilities for multicore targets. Read More
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Integration of JTAGjet-Trace and IAR Embedded Workbench eases ARM development
02 December 2012
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IAR Systems has integrated JTAGjet-Trace into the development tool suite IAR Embedded Workbench for... Read More
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DESIGN East - Parasoft introduces its Open Embedded Testing Platform
18 September 2012
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Parasoft has released of Parasoft Open Embedded Testing platform at DESIGN East Boston. Read More
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Boundary-scan controller supports PXIe/Compact PCI-express slot
29 August 2012
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The DataBlaster JT 37x7/PXIe from JTAG Technologies is the newest in the company's line of... Read More
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PROFIBUS-Diagnostics Suite 2.10 has extended functionality
22 April 2012
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PROFIBUS-Diagnostics Suite 2.10 has extended functions Read More
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UltraFlat process for vertical probe card applications
05 January 2012
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The UltraFlat process from Multitest is designed to meet the requirements of high parallel vertical... Read More
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Module triples EMC testing range to 18 GHz
05 January 2012
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A digital EMC/EMI receiver module from TESEQ extends the frequency range of the PMM 9010 receiver... Read More
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HSIC compliance test software for real-time scopes
05 January 2012
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High-Speed Inter-Chip (HSIC) compliance test software for real-time oscilloscopes has been released... Read More
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Agilent adds handheld scopes with color VGA display
2 comments 05 January 2012
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Agilent Technologies Inc. has added two oscilloscopes to its portfolio of handheld instruments. The... Read More
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Tabor upgrades Pulse Master waveform generators
05 January 2012
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Tabor Electronics has upgraded its Pulse Master series with the PM8571A and PM8572A single and dual... Read More
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Logic protocol analyzer enhanced for PCIe
14 December 2011
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Additional software capabilities for the Tektronix TLA7SA08 and TLA7SA16 Logic Protocol Analyzer... Read More
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XJTAG updates software with auto-suggest library
14 December 2011
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Version 2.6 of XJTAG's boundary scan software development system now comes with a library that can... Read More
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ScanWorks Ethernet controller tests four boards at once
14 December 2011
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The Remote Instrumentation Controller 4000 (RIC-4000) for ASSET InterTech's ScanWorks platform for... Read More
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Wireless comms test set ready for R&D
14 December 2011
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The E5515E 8960 Series 10 wireless communications test set from Agilent Technologies Inc. is... Read More
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Four-channel unit tests multi-receiver systems
07 December 2011
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The 4CH-VSG2000 from X-COM Systems is is a 2U rack-mount unit that combines four... Read More
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Option for RTO scope eases FlexRay interface testing
07 December 2011
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The RTO-K4 option for FlexRay interfaces from Rohde & Schwarz is for use with the company's RTO... Read More
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Tektronix adds 4 HV probes, upgrades others
07 December 2011
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Tektronix Inc.has added four additional high-voltage probes and upgraded three existing probes. Read More
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Sunrise adds OTDR and fiber inspection to test platform
07 December 2011
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The RxT-4000 Fiber Optics Toolkit (FOT) and the FiberScope inspection option has been added to... Read More
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SourcePoint 6.9 supports new cores and trace sources
07 December 2011
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Arium’s most recent version of their SourcePoint debugger for ARM includes many new features,... Read More
Most Read
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The millennium bug revisited
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Mastering stack and heap for system reliability: Part 1 – Calculating stack size
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Basics of real-time measurement, control, and communication using IEEE 1588: Part 5
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Basics of real-time measurement, control, and communication using IEEE 1588: Part 6
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Corelis updates boundary-scan tools
