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Kilopass NVM IP qualified at 130-nm at TowerJazz
2/7/2012 12:23 PM EST
SAN FRANCISCO—Non-volatile memory (NVM) IP vendor Killopass Technology Inc. said Tuesday (Feb. 7) its XPM embedded one-time programmable (OTP) anti-fuse NVM IP has successfully completed 1,000 hours of JEDEC 47 standard qualification for the 130-nm G CMOS process at specialty foundry TowerJazz.
Analog and mixed-signal designers building SoCs on the TowerJazz 130-nm G CMOS process now have a source of anti-fuse NVM IP memory blocks offering 1kb to 1Mb of secure storage for calibration and trim data with over 10 years of reliability and data retention, according to Kilopass (Santa Clara, Calif.). The Kilopass XPM addresses the markets of RF power amplifiers, capacitive sensors, PMIC and other mixed-signal applications, according to the company.
During qualification, three Kilopass test chip lots underwent 1,000 hours of reliability testing for high-temperature operating life and high-temperature storage life on the 130nm G CMOS process, Kilopass said. Successfully completing both from three different wafer lots fulfilled the demands of the JEDEC 47 specification, according to the firm. JEDEC 47 describes the procedure for accelerated life testing at elevated voltages and temperatures that ensure product reliability and data retention for over 10 years.
Kilopass' XPM solutions NVM OTM IP for the TowerJazz 130-nm G process are available for licensing now, Kilopass said. More information is available through a company video on YouTube.
Analog and mixed-signal designers building SoCs on the TowerJazz 130-nm G CMOS process now have a source of anti-fuse NVM IP memory blocks offering 1kb to 1Mb of secure storage for calibration and trim data with over 10 years of reliability and data retention, according to Kilopass (Santa Clara, Calif.). The Kilopass XPM addresses the markets of RF power amplifiers, capacitive sensors, PMIC and other mixed-signal applications, according to the company.
During qualification, three Kilopass test chip lots underwent 1,000 hours of reliability testing for high-temperature operating life and high-temperature storage life on the 130nm G CMOS process, Kilopass said. Successfully completing both from three different wafer lots fulfilled the demands of the JEDEC 47 specification, according to the firm. JEDEC 47 describes the procedure for accelerated life testing at elevated voltages and temperatures that ensure product reliability and data retention for over 10 years.
Kilopass' XPM solutions NVM OTM IP for the TowerJazz 130-nm G process are available for licensing now, Kilopass said. More information is available through a company video on YouTube.
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