JTAG solution for Teradyne ICTsThe USB-1149.1/CFM JTAG hardware platform from Corelis Inc. integrates advanced boundary-scan test patterns into the Teradyne TestStation and GR228x series in-circuit testers testers.
Using the USB-1149.1/CFM with Corelis’ ScanExpress family of JTAG software products, Teradyne users can receive:
- 100 MHz clock rate boundary-scan test support,
- JTAG test vector reusability across multiple manufacturing test stations,
- Testing of IEEE-1149.6 AC-coupled digital networks,
- In-system programming of flash and CPLD devices including direct SPI and I2C support,
- Fully automated boundary-scan test v`
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