A software measurement suite for the Aeroflex PXI 3000 Series of modular instruments supports the Time Division Duplex (TDD) mode of 3GPP Long Term Evolution (LTE) – also known as TD-LTE.
The LTE TDD Measurement Suite provides LTE TDD chipset, handset and terminal device manufacturers with the advanced test capability they need to rapidly characterize device performance. In conjunction with PXI 3000 RF instrumentation and existing LTE FDD measurement suite, Aeroflex can provide RF parametric testing for LTE devices operating in LTE 3GPP TDD and FDD bands.
The LTE TDD Measurement Suite is able to support all uplink and downlink configurations including special sub-frame configuration as defined in 3GPP 36.211 section 4.2. LTE analysis is supported for uplink (SC-FDMA) transmissions for all bandwidths 1.4 MHz to 20 MHz and modulation types QPSK, QAM16 and QAM64.
In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM versus Carrier and EVM versus Symbol. EVM analysis for uplink signals is supported for PUSCH, SRS and PUCCH.
The PXI 3000 LTE TDD Measurement Suite has been tested and verified against the Aeroflex TM500 TD-LTE standard test mobile.