CAMBRIDGE, England XJTAG is launching a free board test service to prospective customers to enable it to demonstrate the speed, efficiency and ease-of-use of its XJTAG boundary scan development system. It is available to any company that has a board that contains at least one JTAG(Joint Test Action Group) device.
Simon Payne, chief executive officer of XJTAG, said, “It will enable us to demonstrate, on a bona fide development board, how, by using the JTAG chain and writing and then reusing test scripts, printed circuits can be tested and debugged in hours/days as opposed to weeks with other competitive systems.”
XJTAG can test a high proportion of a printed circuit including JTAG and non-JTAG devices such as BGA (ball grid array) and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, flash memories, FPGAs, microprocessors and many other devices.
The XJTAG Development System provides a fully-integrated environment which can migrate seamlessly through the product life cycle from early design to field support and repair.
XJTAG test scripts are also re-usable and portable across different boards due to the novel device-centric approach that the designers have adopted. Re-usable device tests and the abstraction of device tests from both circuit detail and complexity of JTAG, mean that designers can quickly develop systems to debug elements of their designs and to functionally test early prototypes.