Corelis Inc. is supporting National Instruments High Speed Digital I/O (HSDIO) instruments with its ScanExpress suite of JTAG test and measurement tools.
The combination of National Instruments hardware with Corelis software is designed to provide a seamless path for deploying boundary-scan test and programming capabilities on existing PCI, PXI, and PXIe test platforms.
Boundary-scan integration support is provided for National Instruments 655x series HSDIO instruments, including the PXIe-6556 model. In addition to functioning as a digital waveform generator/analyzer for characterizing, validating, and testing digital electronics, integration with ScanExpress tools enables these cards to connect to and control a circuit board’s JTAG test access port at voltages as low as 1.2V with test clock speeds up to 30MHz.
The ScanExpress software allows users to select NI 655x series cards through the native GUI interface or alternatively by using LabVIEW, LabWindows/CVI, and TestStand with a DLL-based API interface.
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