DESIGN West - IAR Systems I-scope probe - Embedded.com

DESIGN West – IAR Systems I-scope probe

IAR Systems' new I-scope probe extends the power optimization possibilities available in IAR Embedded Workbench. Used together with IAR Systems’ in-circuit debugging probe I-jet, I-scope lets developers optimize their applications for power consumption and possibly extend battery lifetime by offering them knowledge of the power consumed by individual modules and detect if design flaws in the code are causing unnecessary power consumption.

At any designated point on the target board, I-scope can measure current and voltage with 12-bit resolution at a sampling rate of up to 200 kHz. Through I-jet, the data is synchronized with the running program counter, and can be graphed in real time and analyzed using the C-SPY Debugger. For example, the power analysis can be used to reveal the power consumption of individual functions and peripherals, identify I/O activities that cause current spikes, diagnose low power mode, investigate microcontroller frequency and core voltage power savings and find conflicting hardware setup. It can also be used to reduce radio frequency (RF) emissions by identifying and eliminating unwant ed current spikes and to measure and compare battery consumption in various microcontroller sleep modes.

I-scope is designed to be used as an extension to I-jet, which supports microcontrollers based on all ARM cores. I-jet supports JTAG, Serial Wire Debug (SWD) and Serial Wire Viewer (SWV) using the UART and Manchester encoding modes, as well as Embedded Trace Buffer (ETB).

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