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Tech Focus: Dealing with complex ESD/EMI challenges
HIGHLIGHTS
A standards-based approach to capacitive-sensor EMC problems
How to use finite element methods to simulate system EMF/EMI effects
Tutorial: Improving the transient immunity of your microcontroller-based embedded design – Part 1
Editor's Note
Embedded systems developers remind me of a cat in a field full of grasshoppers, faced as they are with innumerable transient electrical problems in their designs. Early on, before the numbers have gotten too large, the cat jumps from spot to spot, munching away happily on an unexpected source of protein. But as the day progresses and things heat up, there are so many insects that the cat is immobile with indecision. With an insect under each paw and another in its mouth, when it reaches for a nearby flying locust it loses one it already has.
Similarly, with complex system-on-chip designs of high density but increasing transient electrical sensitivities, embedded developers are faced with so many diverse transient system faults that I am surprised they are able to cope. But in “A standards-based approach to capacitive-sensor EMC problems , ” the authors remind us of the one thing that human engineers have – each other – and their ability and desire to communicate with each other about problems and potential solutions in the form of standards organizations. In their article the Azoteq engineers describe how by following basic principles based on industry standards, it is possible to implement designs with high signal-to-noise ratios that will withstand a barrage of noisy abuse.
Embedded developers also have online forums where they can learn about how to deal with such challenges. There are a number of useful recent tutorials and tip sheets on EMI/ESD transient challenges published recently on Embedded.com. Topics include EMC-aware PCB design , an ESD/EMC design guide, a series on EMC basics , and an article on treating your IC as an ESD test chip. Also included are a range of other useful columns, webinars, classes, and white papers, of which my Editor's Top Picks are:
Improving the transient immunity of your MCU-based design
Testing system design components for EMI problems
Reduce EMI with spread spectrum clock generators
Does EMC stand for exasperating, magic or confusing?
Why EMC testing is insufficient, and what is necessary
As devices get more complex and designs move into consumer, home, and industrial environments as full of electrical transients as a field full of grasshoppers, this topic deserves ongoing coverage and discussion. I am continuing my search for more on such issues, but if you have any ideas for blogs, columns, and articles you would like to read – or write – keep in contact with me.
Design How-Tos
Tutorial: Improving the transient immunity of your microcontroller-based embedded design – Part 1
In the first part of a five part series of tutorials, Ross Carlton takes you step by step through the EMI, ESD, and EFT problems you may face in your embedded designs and provides a range of possible solutions
Testing system design components for electromagnetic interference problems
A brief tutorial on electromagnetic interference issue related to ICs, detailing how new standards from the International Electrotechnical Commision will change EMI/EMC testing methods.
Using programmable spread spectrum clock generators for EMI Reduction
To control EMI in consumer devices clock parameters like PLL charge pump current, VCO gain, and output drive strength, need to be programmable to improve system performance, reduce development time, and allows last minute changes.
How to use finite element methods to simulate system EMF/EMI effects
While not perfect, the finite element method (FEM) is a useful way to calculate the effect of electromagnetic interference and the effectiveness of various protective mechanisms.
A standards-based approach to capacitive-sensor EMC problems
By following basic principles based on industry standards, it is possible to implement capacitive sensing designs with high signal-to-noise ratios that will withstand a barrage of noisy abuse.
Design capacitive touch systems for robustness and manufacturability
In this Product How-To design article, Jean Viljoen of Azoteq, details the EMI and other challenges of designing capacitive touch user interfaces and how to use the company's ProxSense auto tuning technology to negate the need for calibration.
EMC Basics #1: Welcome!; and Clocks: critical circuits for EMC
We start a new series on electromagnetic compatibility, with a look at printed circuit board EMC–and the clock circuit is a good place to start.
Does EMC stand for exasperating, magic, or confusing?—Part 1
While it is merely a nuisance to experience radio interference, it is definitely a serious matter if an ABS, stability control, or airbag suffers a malfunction because a vehicle passes a TV tower too closely. Thus, mastering EMC is a basic requirement for automotive electronics designers. Part one of this article explains basic strategies and provides useful hints.
System level transient voltage protection–Five in-depth answers to ESD questions
The challenge of protecting today's systems from transient threats is more complex than ever before. Here are answers to important questions that can ensure that a system is adequately safeguarded against these damaging electrical transient threats.
Why EMC Testing is Insufficient, and What is Necessary – Part One
Electromagnetic Compatibility (EMC) in the automobile industry, is validated by testing the performance of electronic sub-assemblies (ESAs), and complete vehicles, using standardised test methods in an EMC laboratory. This approach is insufficient. But approaches exist to improve the situation.
A guide to designing for ESD and EMC
This application note provides an introductory approach to ESD problems within amusement gaming systems that are exposed to ESD events that range from the normal charge build-up from using the equipment or moving parts due to triboelectric charging to malicious attacks by individuals trying to cheat the system.
Every new design is an ESD test chip
The effect of low ESD immunity on a new product introduction can be both obvious and subtle. Manufacturing and test facilities adhere to ANSI standards for ESD protection and handling of chips based on minimum IC ESD immunity requirements.
Embedded Systems Bookshelf
Excerpts
Embedded Books Reading Room
Bernard Cole's favorite links to book excerpts.
Reviews
Engineer's Bookshelf
Airport fiction blows. A look at books other engineers are reading and why you should read them, too. Recommend and write a review yourself. E-mail Brian Fuller.
Jack Ganssle's Bookshelf
A list of book reviews by Jack Ganssle, contributing technical editor of Embedded Systems Design and Embedded.com.
Max's Cool Beans
Clive “Max” Maxfield, the editor on Programmable Logic DesignLine, often writes about interesting books.
Products
BGA48-packaged MCUs suit wireless sensing apps
Energy Micro has extended the company's EFM32 Gecko range of microcontrollers with the addition of products supplied in a thin, fine-pitch BGA48 packaging.
Embedded networking web server based on Infineon XMC4000 MCUs
Arrow Electronics has developed an embedded web server based on Infineon`s new 32-bit XMC4000 microcontroller family that leverages the ARM Cortex M4 processor.
IEEE802.15.4-certified wireless MCU targets the Smart Grid
STMicroelectronics' STM32W microcontroller is among the first IEEE802.15.4 certified platforms that will support the new ZigBee Smart Energy Profile version 2.0 (SEP 2.0), which defines smart grid scenarios for a “greener” world.
Tektronix delivers test solution for Thunderbolt physical layer electrical validation
Tektronix, Inc. has announced a comprehensive test solution for Thunderbolt technology, a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements.
PLX and One Stop are first to market with PCI Express Gen3-Based industrial-computing platforms
PLX Technology, Inc. and One Stop Systems, Inc. (OSS) have collaborated to deliver what the companies claim are the world's first industrial-grade high-performance computing systems and PCIe-over-cable products based on the PCIe Gen3 standard.
Memoir announces memory generators for dual and 2 port memories
Memoir Systems has announced its first commercial product family: Renaissance™ 2X…
Buck converter aims to increase mobile talk time
Fairchild Semiconductor's buck converter aims to reduce power consumption in GSM/GPRS/EDGE, 3G/3.5G and 4G mobile deigns
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