Enhanced triggering for verifying/debugging complex serial designs - Embedded.com

Enhanced triggering for verifying/debugging complex serial designs

In “Using enhanced triggering to verify and debug complex designs,” Jit Lim of Tektronix, describes the use of advanced triggers, available in the latest generation of oscilloscopes to handle next-generation high-speed serial interconnect requirements.

He details its use in a variety of serial interconnect designs to detect a variety of signal integrity and error conditions such as a pulse that is narrower than it should be.

He also looks at such conditions as amplitude-defined pulses, such as runts or pulses; time-qualified events, such as pulse width, glitch, slew rate, setup-and-hold time, and time-out; both amplitude and time using window triggering; or logic-state- or pattern-delineated events, such as logic triggering.

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