HCC: fail-safe FTL for NAND to include deterministic operation - Embedded.com

HCC: fail-safe FTL for NAND to include deterministic operation

HCC Embedded has extended its existing flash translation layer (FTL) solution for NAND with the addition of deterministic execution control. Engineers integrating NAND flash into safety-based systems in automotive, aerospace, and industrial applications can use HCC’s SafeFTL to ensure stable and predictable operation of the NAND flash. HCC’s new deterministic SafeFTL has been fully verified both in simulated environments and on real NAND flash arrays.

Traditionally, NOR flash has been the dominant memory in highly reliable systems, but more recently engineers are integrating NAND flash into safety systems where information must be predictably available. An FTL manages an array of NAND flash to create a logical interface that software can use. This includes wear leveling, bad block handling, and the many other subtleties of managing NAND flash. However, existing FTLs all stall at some point for a variable period of time, particularly when placed under heavy load.

Safety-critical systems demand a different approach that ensures stability and predictability above all else. For these systems, where accurate time division is critical to the delivery of safety, engineers can use HCC’s deterministic SafeFTL to integrate arrays of NAND flash without disturbing the predictability of the system. Deterministic FTL builds on HCC’s SafeFTL by enabling the host or safety system to know how long operations will take and respond by either scheduling tasks appropriately or executing them in multiple steps. The host system gets the length of time a flash operation will take from the FTL and can schedule an appropriate time slot, or can spread complex operations over multiple time slots, while leaving the NAND flash accessible to other tasks.

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