LDRA tools integrate with LabVIEW DO-178 certification - Embedded.com

LDRA tools integrate with LabVIEW DO-178 certification

The LDRA tool suite has been integrated with National Instruments LabVIEW Virtual Instruments to provide  hardware-in-the-loop (HIL) simulation, a technique used to develop and test the complex real-time embedded systems commonly found in military and aerospace designs.

The combination means NI's hardware testing capabilities are fully matched with the software competencies necessary to achieve DO-178 certification up to and including Level A.   

By using the joint NI hardware testing capabilities with LDRA’s software testing expertise, developers can simulate how a complete hardware-software system will react to real-life test conditions.

Used in conjunction with NI’s hardware, LabVIEW Virtual Instruments creates a simulated system with an extensive range of capabilities for testing target hardware that includes signal generation, signal measurement, control actuation and real-time measurements. When these systems are exposed to an range of test data, they simulate the responses of a system to the data, enabling developers to identify the likely response of a target system under test.

The integration with the LDRA tool suite ensures that software analysis is applied to the systems under test on the simulated target hardware. With the ability to test software systems up to DO-178 Level A, LDRA includes code standards enforcement, structural coverage analysis including modified condition/decision (MC/DC), object code coverage, unit testing, data and control coupling, and requirements traceability.

Click on image to enlarge.

The integration allows LDRA’s automated unit testing tool TBrun to generate inputs to and read outputs from LabVIEW Virtual Instruments, resulting in bidirectional control and data collection.

Test harnesses for customers using the integrated products can be run with the software fully simulated in LabVIEW or with hardware-in-the-loop using NI’s Reconfigurable Input/Output technology. Data is collected in one location, reducing expensive testing time by collecting test results for certification evidence in a single location. Also, on-target testing can be minimized because the same software tests can be run on both the simulated and actual target hardware using the same test cases.

With the integration of LabVIEW Virtual Instruments into the LDRA software test harness, standard-specific tests can be run. Although this rigor is commonly found in DO-178 applications, analogous medical and industrial qualification environments also demand extensive testing.

LDRA’s standard-specific templates that streamline certification processes ensure that this level of testing competency can be extended and tailored to many industrial standards, such as ISO 26262, IEC 62304 and IEC 61508.

If you found this article to be of interest, visit the Test & Measurement Designline where you will find links to relevant technical articles, blogs, new products and news.

You can also get a weekly newsletter highlighting the latest developments in this sector – just Click Here to request this newsletter using the Manage Newsletters tab – if you aren't already a member you'll be asked to register.

Leave a Reply

This site uses Akismet to reduce spam. Learn how your comment data is processed.