Datalight has released the latest version of its FlashFX Tera product with enhancements for NOR device long-term reliability features as well as refinements to validation tests for multi-level cell NAND flash and enhanced support for i.MX family of processors from NXP.
Ensuring long-term reliability for flash media requires careful attention to the physical degradation that occurs over time which leads to bit errors and device failure. While FlashFX Tera has managed data retention and error handling challenges for NAND flash media since its inception, but NOR flash has heretofore not required such sophistication. Now customers are beginning to suspect similar longevity concerns for NOR flash media and Datalight has responded with enhancements to error detection and correction focused on NOR flash. This software solution allows the data from blocks with correctible errors to be rewritten elsewhere while the original block is fully erased for future reuse. In addition to correcting single bit errors, two-bit errors are detected for proper handling by the design.
Customers who place a premium on device cost often choose MLC NAND flash as their storage media. FlashFX Tera is acknowledged as the market leader in support for MLC NAND flash media and is the only flash manager with robust MLC support on Linux, as such support has been deprecated from open source solutions. This release offers refinements to the Flash Memory Services Layer (FMSL) test for this media type. This Flash Media test is crucial to exercise all aspects of implementation and customization of both the drivers and the hardware. Like all Datalight tests which are included with its products, the full source code is provided for ease of customization and finding hardware errors from within a debugger.
FlashFX Tera continues to support the NXP series of application processors with an updated version of our i.MX family NAND Technology Module, which is designed to support i.MX8, i.MX7 and i.MX6 processors.