Logic Technology: J-Testr RF, a new test solution for the IoT - Embedded.com

Logic Technology: J-Testr RF, a new test solution for the IoT

Eiger Design, an innovative supplier of functional circuit test solutions to the electronics test market, announced the launch of a new test solution for todays integrated RF devices (e.g. Bluetooth, LORA, WIFI) and other RF applications including ISM 433MHz.

The J-Testr RF is a test solution designed specifically to test todays integrated RF devices for the IoT (Bluetooth, LORA, WIFI, etc.) and other RF applications (including ISM 433MHz). With a compact, space efficient footprint, competitive pricing, advanced features and flexibility the J-Testr RF enables large and small companies to effectively test their RF devices with confidence and significantly improve the quality of testing at the printed circuit board assembly stage.

Integrating an ‘exchangeable’ high RF isolation chamber, with full fixture (bed of nails) capability, the device under test, and its measurements, are shielded from almost all environments. The J-Testr RF eliminates the need for special ‘low RF noise’ rooms within a production environment and provides high quality and repeatable measurements. Special consideration has been given to ease of integration with open access to the RF chamber plus intelligent cabling and connector layout, creating a simple and cost- effective test solution.

RF instruments are integrated in such a way as to enable them to be controlled manually or automatically, via test sequencer software, that allows quick testing or debugging of devices with little or even no test software support. The RF instruments include digital displays at the user interface enabling the user to see the current RF signal measurement/outputs even during an automated test.

Designed not only to test RF functions the J-Testr RF includes a fully integrated standard J-Testr system with all the stimulation signals present within non-RF function test systems, which allows the device to receive a full functional test without the need for another test stage. These standard functional test features allow the same test station to be used for non-RF devices using low-cost standard J-Testr exchangeable kits extending the return on investment.

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