Mil-aero conference looks for solutions - Embedded.com

Mil-aero conference looks for solutions

LONDON — National Instruments is holding a one day Military and Aerospace Solutions Conference next month.

The conference, being held at the Royal Air Force Museum, Hendon, London, on May 21, will provide information on the latest developments in automated test, measurement technology and embedded design specifically for the military and aerospace industries.

The event will include demonstrations, case studies and hands-on sessions on the latest technologies for virtual and synthetic instrumentation featuring:

Advances in Automated Test: incorporating longevity and advanced functionality into the design of complex, next generation test systems for military and aerospace applications. High Speed

Communications: implementing flexible software-defined test for RF and high speed digital technology.

Measurement and Control: adding measurements to military and aerospace applications, from embedded control using FPGA's and reconfigurable I/O; to high channel count and structural testing.

With a focus on using graphical system design to create software defined solutions with PXI and FPGA modular hardware, this conference provides an opportunity to learn about new technologies and network with your peers.

For a more detailed technical description click here

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