PARIS – National Instruments has expanded its SC Express PXI sensor measurement family with the introduction of the NI PXIe-4357 resistance temperature detector (RTD) module. Optimized for temperature measurements sensor-specific signal conditioning, the module can be used with the NI SC Express family, PXI and the NI LabVIEW real-time module. It is suitable for structural test applications in transportation, aerospace and defense industries.
This 20-channel module features five 24-bit delta-sigma analog-to-digital converters with antialiasing and low-pass filters to achieve typical measurement accuracies of 0.09°C. The module features both a high-speed mode (100 S/s per channel) and a high-resolution mode (1 S/s per channel).
The NI TB-4357 front mount terminal block provides screw terminal connectivity for 2-, 3-, or 4-wire RTDs. The NI-DAQmx device driver software included with the module gives the flexibility of per channel software-programmable configurations and automatically scales measured data into engineering units.
NI PXIe-4357 RTD module features:
. 20 channels for PT100 RTDs; 0.09°C typical accuracy
. 100 S/s/ch sample rate in high-speed mode; 1 S/s/ch sample rate in high-resolution mode
. 2-, 3-, or 4-wire RTDs supported
. 0.9 mA current excitation source per channel
. Multidevice triggering and synchronization via PXI Express
. NI-DAQmx driver software and NI LabVIEW SignalExpress LE interactive data-logging software
To access the datasheet , click here .
To access a technical whitepaper, click here.
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