NI to add LTE automated test capabilities to PXI RF portfolio - Embedded.com

NI to add LTE automated test capabilities to PXI RF portfolio

National Instruments is adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio via the NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers.

Designed for testing 3GPP LTE wireless components, subsystem components and mobile stations, the software-defined test system will provide a flexible and accurate solution for engineers developing automated validation and production test systems for LTE products.

The LTE Measurement Suite is a test system based on NI automated test software and PXI modular instrumentation. The system consists of NI LTE Measurement Suite software, the NI PXIe-5663E 6.6 GHz vector signal analyzer, the NI PXIe-5673E 6.6 GHz vector signal generator and a PXI chassis and controller.

The system's hardware can be used to test previous RF and wireless standards as well as LTE and other next-generation standards. According to initial performance results, the LTE test system can achieve modulation accuracy measurements (RMS EVM) as low as -48 dB and perform automated measurements up to 3X and 5X faster than traditional instrumentation.

The LTE Measurement Suite joins a portfolio of NI hardware and software solutions for wireless test including test software for cellular standards such as GSM/EDGE and WCDMA/HSPA+ and software for testing fixed/mobile WiMAX, wireless LAN, GPS, AM/FM and Bluetooth products.

The LTE test system also complements additional RF measurement tools from National Instruments such as signal generators, signal analyzers, power meters and other DC and baseband instruments. As an added benefit of its software-defined PXI configuration, the system integrates with more than 1,500 PXI instruments from NI and more than 70 other vendors to address the requirements of almost any test application.

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