Power amps tested using PXI - Embedded.com

Power amps tested using PXI

European Microwave Week: National Instruments demonstrated a complete PXI-based solution for RF power amplifier (PA) validation and production test.

The NI PXI solution for power amplifier test integrated a variety of mixed-signal instruments to meet the requirements for precise PA test in validation and production environments.

The demonstration featured the latest NI PXI instruments including the NI PXIe-5665 14 GHz vector signal analyzer, the NI PXIe-6556 digital per pin parametric measurement unit (PPMU), the NI PXIe-4154 battery simulator and the NI PXIe-5186 12.5 GS/s, 5 GHz digitizer.

With these PXI-based modular instruments, engineers can perform a variety of PA tests and measurements such as power versus time (PVT), error vector magnitude (EVM), adjacent channel leakage ratio (ACLR), current leakage, harmonics and open-shorts tests.

The solution joins an expansive selection of NI PXI tools, which currently includes more than 450 different PXI modules to address virtually any engineering challenge.

NI says the PXI Express bus results in test speeds that are up to 10 times faster than traditional box solutions and the company also provides software to address the wide variety of RF standards including LTE, GSM/EDGE , WCDMA, WLAN, WiMAX, ZigBee and Bluetooth.


www.ni.com/patest

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