PXI-based semiconductor test system - Embedded.com

PXI-based semiconductor test system

The TS-900 PXI-based test system from Geotest for component, SoC and SiP  test applications. Offering  up to 512, 100 MHz channels  with  per-pin PMUs and an integrated receiver interface, the modular TS-900 includes both hardware and software capabilities for digital and mixed–signal test applications.

The custom-designed,  test interface supports the use of PCB device under test boards and the receiver interface’s pin blocks are field configurable, allowing users to upgrade the receiver when they modify or upgrade the system for new applications.

The system supports 64 to 512 dynamic digital channels as well as a range of analog, power
supply and RF resources. Uses of the PXI architecture has enabled Geotest has been able to
develop a test system for semiconductor OEMs, fabless semiconductor vendors and packaging / test vendors needing a low cost, modular and configurable test system.

The basic TS-900 test system includes 64, 100 MHz digital I/O channels; 64 static digital I/O channels; a programmable user power supply; a system self-test and fixture. The software supplied with the TS-900 includes Geotest’s DIOEasy  for digital waveform editing / display and  ATEasy  which provides an integrated and complete test executive and test development environment

Software tools are available for converting digital vectors from ASCII, WGL or STIL formats. The TS-900 is available in both bench top or cart configurations – providing additional flexibility for laboratory or production floor applications.

The base system of the TS-900 is priced at less than $75K.  

Leave a Reply

This site uses Akismet to reduce spam. Learn how your comment data is processed.