Renesas Electronics announced the development and successful operation verification of an automotive test chip as a technological stepping stone toward the realization of next-generation automotive-control flash MCUs employing a 28 nm low-power process.
The microcontroller features four 600MHz CPUs with a lock-step mechanism and a large 16 MB flash memory capacity, as well as virtualization-assisted functions enabling MCU virtualization: This technology allows multiple software components to run on a single MCU without interfering with each other, thereby satisfying the requirements of ASIL D, the highest automotive safety integrity level specified under the ISO 26262 functional safety standard for road vehicles. Enhanced built-in self-test (BIST) functionality for MCU self-diagnostic fault-detection are necessary to implement ASIL D, thanks to a newly developed standby-resume BIST (SR-BIST) function that is executed during the standby-resume period. The MCU also features enhanced networking functionality, including Gigabit Ethernet interface for high-speed transfer of sensor information.
Renesas will present the test results in the session, “A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture Complying with ISO26262 ASIL D,” on February 18 at International Solid-State Circuits Conference 2019.
Based on the technologies verified in the test chip, Renesas plans to aggressively develop new 28 nm flash MCUs and continue its commitment to enabling a new generation of eco-friendly and autonomous driving cars and helping to realize a safer and more secure driving experience.