Rohde & Schwarz presents innovative T&M equipment for embedded systems

At embedded world, Rohde & Schwarz will showcase its R&S RTP high-performance oscilloscope family, along with further highlights such as a new frequency response analysis option using Bode plots, the world's first signaling test solution for Bluetooth LE, and a brand new power supply series.

The high-performance oscilloscopes of the R&S RTP family combine exceptional signal integrity with a high update rate and multiple instrument capabilities. The whisper-quiet oscilloscopes acquire up to 1 million waveforms per second and perform realtime deembedding to correct transmission losses between the signal source and the oscilloscope. This correction is usually made by filtering the acquired waveforms during postprocessing. With conventional oscilloscopes, this requires a great deal of patience on the part of the user. In contrast, with the R&S RTP, the correction can also be made using flexible filter structures directly after the A/D converters. With that approach, the R&S RTP displays the waveforms without transmission losses, i.e. as they appear at the DUT output; there is no time wasted with lengthy calculations during postprocessing. All these features combine to make the R&S RTP the oscilloscope of choice for debugging – for example when testing electronic systems or highly integrated electronic circuits with high-speed digital or wideband RF interfaces. The oscilloscope comes in three models with different bandwidths: 4 GHz, 6 GHz and 8 GHz.

Another highlight is the new R&S RTx-K36 software option for the R&S RTB2000, R&S RTM3000 and R&S RTA4000 oscilloscopes. It can be used to measure the transfer function of active and passive DUTs in terms of gain and phase in the frequency range from 10 Hz to 25 MHz. The oscilloscope's integrated arbitrary waveform generator delivers the stimulus signal. Results, i.e. the gain and phase versus frequency, are plotted as Bode diagrams. The R&S RTx-K36 is especially useful for switched-mode power supplies in order to measure and tune the control loop response and the power supply rejection ratio (PSRR). The amplitude and phase margins can be read directly from the Bode plots.

Rohde & Schwarz will demonstrate the world's first signaling test solution for Bluetooth Low Energy (Bluetooth LE, BLE), allowing manufacturers to perform RX/TX tests on their BLE wireless modules. The main challenge here is that these devices often have no port or interface to connect to a control line for testing them in direct test mode (DTM) as stipulated by the Bluetooth LE standard. The BLE signaling test solution for the R&S CMW test platform is unique on the market. It allows the RF characteristics of a BLE device to be determined via a Bluetooth OTA connection, i.e. without the use of a control cable. The R&S CMW test platform offers three RF test modes for characterizing BLE devices: the new BLE signaling functionality, BLE direct test mode and BLE advertising mode.

Rohde & Schwarz has re-engineered its power meter portfolio and will present its new R&S NRX at embedded world. The power meter base unit offers up to four measurement channels and a touch GUI. The R&S NRX even supports triggered and synchronized multichannel measurements, including with a combination of terminating and directional power sensors. Users can connect a wide variety of thermal and diode based terminated power sensors to the R&S NRX ports, as well as the frequency selective R&S NRQ6 power sensor.

In addition, Rohde & Schwarz will premiere its new R&S NGL200 power supply series and showcases its R&S ELEKTRA EMC test software.

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