Software aids RF parametric testing of dual-carrier HSDPA mobile devices - Embedded.com

Software aids RF parametric testing of dual-carrier HSDPA mobile devices

Software for the Anritsu MT8820C radio communications analyzer allows developers and manufacturers of dual-carrier HSDPA (DC-HSDPA) mobile devices and data cards to measure the RF parametric performance of products according to 3GPP standards.

Integrating the software with the Parallelphone Measurement (PPM) function of the MT8820C creates a single-instrument solution for DC-HSDPA-capable UEs and data cards.
 
The MT8820C supports both call processing and parametric tests recommended by the 3GPP Release 8 standard, when the software is installed. The software expands the W-CDMA measurement capability of the MT8820C to allow for complete RF parametric test capability from Rel. 99 to Rel.8.
 
The analyzer can conduct Tx and Rx measurements on all popular wireless systems. In addition to W-CDMA Rel. 8/DC-HSDPA, the MT8820C offers full test support for GSM/GPRS/E-GPRS, 1xRTT/1xEV-DO, TD-SCDMA/HSPA, W-CDMA Rel. 99 to Rel. 7, and LTE. Due to this broad support, it is well-suited for testing multimode devices that include historical 2G and 3G modes.
 
A full suite of RF parametric and functional tests are available with the MT8820C. Functional tests supported include voice calls, video calls, and current consumption. Parametric tests include traditional UE transmitter and receiver tests, as well as new DC-HSDPA capability for measurement of Rx throughput, with support for these measurements in either signaling or non-signaling mode.
 
Production-line test speed and throughput can be improved when the PPM option is installed in the MT8820C. When used for testing non-DC-HSDPA devices, this option allows for simultaneous testing of two mobile devices or data cards (or a combination of both) using a single MT8820C, reducing test time and cost-of-test, as well as conserving space. This option also allows for functional or parallel physical layer testing of dual-radio devices.

Manufacturing and inspection test times are further reduced by advanced/high-speed DSP, as well as integrated chipset-specific high-speed calibration modes.
 
The MT8820C also allows users to select multiple test items for parallel and simultaneous measurement from one data sample. One-touch operation supports easy and quick measurement of Tx and Rx parametrics, including transmit frequency, modulation accuracy, transmit power, spectrum emission mask, adjacent channel leakage power ratio, occupied bandwidth, and BER/BLER.

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