SourceMeter powers up for semiconductor test - Embedded.com

SourceMeter powers up for semiconductor test

The latest addition to the Keithley Instruments Inc.'s Series 2600A System SourceMeter family is the 2651A  which is designed for characterizing high power electronics.

The 2651A is a four-quadrant voltage and current source/load coupled with precision voltage and current meters, combining the functionality of multiple instruments in a single full-rack enclosure.

It includes a semiconductor characterization instrument, precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load, and trigger controller. Units can be combined into a multi-channel synchronized via Keithley’s TSP-Link technology.

The Model 2651A can source or sink up to 2,000W of pulsed power (±40V, ±50A) or 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A). It can also make precise measurements of signals down to 1pA and 100 microvolts at speeds up to one microsecond per reading.

It provides a choice of digitizing or integrating measurement modes for precise characterization of both transient and steady-state behavior. Two independent analog-to-digital converters (ADCs) define each mode—one for current and the other for voltage—which run simultaneously for accurate source readback without sacrificing test throughput.

The digitizing measurement mode’s 18-bit ADCs allow capturing up to one million readings per second for continuous one-microsecond-per-point sampling, making this mode the most appropriate choice for waveform capture and measuring transient characteristics with high precision. Solutions which average multiple readings to produce a measurement result don’t always allow the measurement of transient behavior.

The integrating measurement mode is based on 22-bit A/D converters and ensures precise measurements of the very low currents and voltages common in next-generation devices. All series 2600A instruments provide integrating measurement mode operation.

Connecting two Model 2651A units in parallel via TSP-Link expands the system’s current range from 50A to 100A. The voltage range can be expanded from 40V to 80V when two units are connected in series. The embedded Test Script Processor (TSP) included in all series 2600A instruments simplifies testing by allowing users to address multiple units as a single instrument.

A built-in trigger controller can synchronize the operation of all linked channels to within 500 nanoseconds.

The unit is suitable for a range of high current, high power test applications, including power semiconductor, HBLED, and optical device characterization and testing; Characterization of GaN, SiC, and other compound materials and devices; semiconductor junction temperature characterization and reliability testing. It can also provide high speed, high precision digitization and be used for electromigration studies.

A common problem with high power semiconductors and materials  is device self-heating during tests and to reduce this the 2651A provides high speed pulsing capabilities that allow users to source and measure pulses with high accuracy. Pulse widths from 100 microseconds to DC and duty cycles from 1 percent to 100 percent are programmable.

The embedded TSP Express LXI-based I-V test software utility and provides device data in three steps: connect, configure, and collect. It also simplifies connecting instruments to allow higher pulsing levels. Results can be viewed in either graphical or tabular format and then exported to a .csv file for use with spreadsheet applications.

Two other software tools for creating test sequences are also provided. The Test Script Builder application supports creating, modifying, debugging, running, and managing TSP scripts. An IVI-based LabVIEW driver simplifies integrating the Model 2651A into LabVIEW test sequences.

Leave a Reply

This site uses Akismet to reduce spam. Learn how your comment data is processed.