Tektronix introduces one-stop PCIe 3.0 testing and debug - Embedded.com

Tektronix introduces one-stop PCIe 3.0 testing and debug

Tektronix now offers designers a single destination for PCI Express 3.0 testing with its automated transmitter (Tx) and receiver (Rx) compliance and debug testing solution for the PCI Express 3.0 standard.

For PCIe3 Rx testing, stressed pattern generation as required by PCI-SIG test specifications, is automated and now includes integrated support for clock multiplication and eye opening tests. Additionally, DUT loopback control is automated, simplifying the testing process and cutting down on time to test results. Enhancements to enable these capabilities include the new DPP125C which adds pre-emphasis to the stressed pattern, the new BSAITS125 integrated interference combiner with variable ISI, and the new BSAPCI3 automated calibration, loopback and link training software.

Other components include a Tektronix AFG3000 arbitrary/function generator for common mode interference testing and the PLL loop bandwidth solution based on the world-classCR286A series clock recovery unit. These complements to the BERTScope eliminate the need for third-party add-ons.

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