Tools integrate for jitter and pre-emphasis analysis up to 28.1 Gbit/s - Embedded.com

Tools integrate for jitter and pre-emphasis analysis up to 28.1 Gbit/s

A Jitter Modulation Source and the MP1825A 4-Tap Emphasis converter from Anritsu are designed to be integrated with the MP1800 signal quality analyzer (SQA) to create a test solution that supports jitter tolerance tests and generates emphasis signals up to 28 Gbit/s, for accurate evaluation of high-speed interconnects.

It will be useful for design and manufacturing engineers in conducting accurate signal integrity measurements on devices and printed circuit boards designed into digital transmission equipment and backplanes used for high-speed data transmission.
 
Complementing the existing signal generation and error detection functions of the MP1800 SQA, the Jitter Modulation Source can add any combination of sinusoidal jitter/random jitter/bounded uncorrelated jitter/spread spectrum clocking (SJ/RJ/BUJ/SSC) to a 28 Gbit/s signal.

SJ, RJ, BUJ, and SSC can be injected into the device under test (DUT) simultaneously. Low intrinsic random jitter (typically 300 fs at 25 Gbit/s) ensures that a high-quality signal is generated by the MP1800.  

Jitter signals outputted by the MP1800 equipped with the Jitter Modulation Source are converted to a 4 tap pre-emphasis signal by the MP1825B 4-Tap Emphasis instrument. The MP1800 configured with the 4-Tap pre-emphasis converter allows backplane designers to validate eye-opening simulations by using emphasized signals to accurately compensate for losses in high-speed data communications channels.
 
The four taps can be set as pre- or post-cursors with 20 dB of setting range. This helps ensure effective evaluation of the characteristics of high-speed interfaces below 10 Gbit/s, such as PCIe, USB, and backplane Ethernet requiring pre-emphasis signals, as well as Infiniband 26G-IB-EDR, CEI-28G-VSR, etc., in the 25/28 Gbit/s band.

 
At the center of the solution is the MP1800, an all-in-one SQA that incorporates pulse pattern generators (PPG) and error detectors (ED). It supports direct bit error rate (BER) measurements and quality analyses of serial digital signals from 100 Mbit/s to 56 Gbit/s. Its modular design offers a flexible cost-effective solution for measuring at the optimum BER. One-touch key operations simplify complex searches for input thresholds and phase adjustments.

The MP1800 is also suitable for R&D of 100 GE systems, optical modulators, high-speed logic, ICs, digital systems, and PONs.

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