Avinash Aravindan is a Staff Systems Engineer at Cypress Semiconductor. His responsibilities include defining technical requirements and designing PSoC based development kits, system design, technical review for system designs and technical writing. He has 8+ years of industry experience. He earned his Master’s Degree on Master of Science in Research on Information and Communication Technologies (MERIT) from Universitat Politècnica de Catalunya, Barcelona, Spain and B.Tech from Cochin University of Science and Technology, Cochin, India. His interests include embedded systems, high-speed system design, mixed signal system design and statistical signal processing.


's contributions
    • Data reliability is the most critical aspect of data storage, driving a need for use of different methods to detect and correct Flash memory errors or avoid them altogether.

    • The errors in NAND Flash can be classified into two major categories: permanent (non-correctable) errors due to memory wear and temporary (correctable) errors of various types.

    • Continuing the Flash 101 series, this article examines the different types of NAND Flash based on their internal architecture or the way data is stored in the memory cells.

    • This article continues this series on Flash with a look at the electrical interface of different types of NOR Flash devices and how they impact device selection and design.

    • Embedded system designers must take into account many considerations when selecting a Flash memory for their systems. This article series discusses these considerations, beginning in this article with the differences between NOR Flash and NAND Flash.