Keithley Instruments Inc. is to broadcast a free, webinar titled “Fundamentals of Bias Temperature Instability and State-of-the-Art Measurement Methods” on Thursday, December 16, 2010.
This one-hour presentation is designed to help reliability engineers understand and implement state-of-the-art Bias Temperature Instability (BTI) measurements using ultra-fast I-V (current-voltage) methods.
The first segment of the webinar examines the current theory of positive and negative BTI (PBTI and NBTI) mechanisms in ultra-thin-film transistors. The second segment addresses the measurement challenges and defines the best methods for ultra-fast I-V measurements for capturing both degradation and recovery characteristics.
The online event also features an interactive question and answer session. The event is free to the public, but participants must register in advance at http://www.keithley.info/bti.