Wireless comms test set ready for R&D - Embedded.com

Wireless comms test set ready for R&D

The E5515E 8960 Series 10 wireless communications test set from Agilent Technologies Inc. is designed for R&D engineers who need to stress their 2G/3G/3.5G designs at the maximum data rates.
 
The E5515E is an enhancement to the 8960 wireless test set and is equipped with dual downlink paths, a more powerful processor and other hardware improvements.

It provides sustained 42-Mb/sec DC HSDPA throughput and extensive handovers between 2G/3G and LTE, for comprehensive 2G/3G/3.5G/LTE testing together with the Agilent PXT E6621A wireless communication test set for LTE.

The test set supports the latest TD SCDMA advancements such as TD HSDPA 2.8-Mb/sec IP data connections, TD HSUPA signaling and test-mode connections, and TD SCDMA protocol logging.
 
The dual RF downlink paths allow testing of DC HSDPA at the maximum 42-Mb/sec data rate and support testing of future multiple-output technologies.
 
The E5515E wireless test set complements the currently available E5515C which provides  repeatable and standards-compliant 2G/3G/3.5G RF measurements for both R&D and manufacturing. Existing E5515C test sets can be upgraded to E5515E hardware to support the latest 3.5G technologies such as 42-Mb/sec DC HSDPA.
 
Agilent E5515E 8960 Series 10

Leave a Reply

This site uses Akismet to reduce spam. Learn how your comment data is processed.