Cambridge, UK XJTAG has introduced a “try-before-you-buy” version of its XJTAG Development System.
Developers and test and field engineers can now obtain a time-limited but fully featured copy of the system via the XJTAG web site. The trial enables potential customers to try the system which can test JTAG (Joint Test Action Group) as well as non-JTAG devices.
The company is providing support during the evaluation period to ensure that users can get up and running and evaluate the solution before making a purchase.
XJTAG can test a high proportion of the circuit including BGA and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, flash memories, field programmable gate arrays, microprocessors and other devices. XJTAG also enables in-system programming of FPGAs, complex programmable logic devices) and flash memories.
According to the company, the development cycle and prototyping process can be shortened by enabling early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits that utilise the same devices.
The device-centric approach that the designers have adopted means that XJTAG test scripts are also re-usable and portable across different boards. Re-usable device tests and the abstraction of device tests from both circuit detail and complexity of JTAG, mean that designers can develop systems to debug elements of their designs and to functionally test early prototypes.